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SPECIMEN CHUCK CIRCULAR 40MM QS/MICR WHT

Catalog Number: 76948-768
Supplier: Mortech Manufacturing
Product Image-103302-696

Muscovite Mica V-1 Quality 50x75mm

Description: Muscovite Mica V-1 Quality, determination by visual quality classification ASTM, Clear, Hard, of uniform color, nearly flat, maximum operating Temperature: 500-600 deg C, free of all stains, foreign inclusion, cracks, thickness: 0.15 - 0.21mm, mica size: 50x75mm
Catalog Number: 103302-696
Supplier: Electron Microscopy Sciences


Image Unavailable-76948-784

SPECIMEN CHUCK WAFFLE 30MM QS/MICR WHT

Catalog Number: 76948-784
Supplier: Mortech Manufacturing
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SPECIMEN CHUCK WAFFLE 40MM RED

Catalog Number: 76948-606
Supplier: Mortech Manufacturing
Product Image-103306-270

Numbered Gunshot Residue Sampler

Description: Numbered Gunshot Residue Sampler
Catalog Number: 103306-270
Supplier: Electron Microscopy Sciences


Product Image-102091-310

Aluminum Mounts 1Inchx3/8Inch 100/Pk

Catalog Number: 102091-310
Supplier: Electron Microscopy Sciences


Product Image-102098-144

Sem Mount 1Inch 3-Division 100/Pk

Catalog Number: 102098-144
Supplier: Electron Microscopy Sciences


Product Image-102098-142

Sem Mount 1Inch 3-Division 50/Pk

Catalog Number: 102098-142
Supplier: Electron Microscopy Sciences


Product Image-100502-718

7x7cm plain glassine env.

Catalog Number: 100502-718
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-102098-246

Sem Mount 25 X 20Mm 100/Pk

Catalog Number: 102098-246
Supplier: Electron Microscopy Sciences


Product Image-102098-248

Sem Mount Jeol 32X 5 Mm 10/Pk

Catalog Number: 102098-248
Supplier: Electron Microscopy Sciences


Product Image-103302-888

Muscovite Mica V-2 Quality 50 x 75mm

Description: Muscovite Mica V-2 Quality, visual quality classification ASTM, Clear and Slightly Stained - Hard, of uniform color, nearly flat and may contain slight crystallographic discoloration, and very slight air inclusions, thickness: 0.15 - 0.21mm, mica size: 50x75mm
Catalog Number: 103302-888
Supplier: Electron Microscopy Sciences


Image Unavailable-76948-864

SPECIMEN CHUCK WAFFLE 40MM SHANDON WHT

Catalog Number: 76948-864
Supplier: Mortech Manufacturing
Product Image-103306-150

K-kit 2.0 Gap

Description: K-kit, Gap height: 2.0um, are sample holders designed to facilitate convenient TEM observation of liquid samples, allowing nano-objects, and agglomerates (NOAAs) in liquid samples to be characterized, With vacuum compatible sealing of liquids in electron-transmitting thickness, Pack 4
Catalog Number: 103306-150
Supplier: Electron Microscopy Sciences


Image Unavailable-76948-800

SPECIMEN CHUCK WAFFLE 40MM QS/MICR WHT

Catalog Number: 76948-800
Supplier: Mortech Manufacturing
Product Image-102098-244

Sem Mount Jeol 25X 20Mm 50/Pk

Catalog Number: 102098-244
Supplier: Electron Microscopy Sciences


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