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Description: SiO X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with consistent backgrounds with low field-to-field variability and high x-ray transmission, For correlative optical and x-ray microscopy, 500um Dimension square, Membrane thickness: 300nm
Catalog Number: 76439-548
Supplier: ELECTRON MICROSCOPY SCIENCE


Catalog Number: 100503-602
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 100503-600
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 100503-598
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 102773-514
Supplier: Electron Microscopy Sciences


Catalog Number: 77565-704
Supplier: Electron Microscopy Sciences

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Catalog Number: 76243-372
Supplier: DAZOR LIGHTING TECHNOLOGY TE


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 100um, Membrane: 50nm
Catalog Number: 76439-552
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1500um, Membrane: 200nm
Catalog Number: 76439-558
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 100nm
Catalog Number: 76439-554
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 2500um, Membrane: 200nm
Catalog Number: 76439-560
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 50nm
Catalog Number: 76439-550
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1000um, Membrane: 100nm
Catalog Number: 76439-556
Supplier: ELECTRON MICROSCOPY SCIENCE


Catalog Number: 100488-088
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 100488-086
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 76253-278
Supplier: FLORIDA BULB & BALLAST INC TE


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