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Aluminum single standard

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Supplier: Electron Microscopy Sciences

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CADMIUM SINGLE STANDARD

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IRON SINGLE STANDARD

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Scandium single standard

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Cambridge Brass Sgl St

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Austenitic S Steel Sgl St

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Soda-Lime Silica Glass Sngle

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St High Silic Steel Sgl St

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Cr 19% Ni 12%, Mo 3% Sgl St

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Biological set w/25mm dia block-18 st

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Biological set w/32mm dia block-18 st

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Product Image-76439-548

SiO X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with consistent backgrounds with low field-to-field variability and high x-ray transmission, For correlative optical and x-ray microscopy, 500um Dimension square, Membrane thickness: 300nm

Description: SiO X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with consistent backgrounds with low field-to-field variability and high x-ray transmission, For correlative optical and x-ray microscopy, 500um Dimension square, Membrane thickness: 300nm
Catalog Number: 76439-548
Supplier: ELECTRON MICROSCOPY SCIENCE
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Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 2500um, Membrane: 200nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 2500um, Membrane: 200nm
Catalog Number: 76439-560
Supplier: ELECTRON MICROSCOPY SCIENCE
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