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Image Unavailable-EM1.13990.5000

Spectromelt® C 10 grinding and tabletting aid, for XRF (X-ray fluorescence), Supelco®

Description: Tabletting the sample as a preparation for X-ray fluorescence (XRF) to fusion.
Catalog Number: EM1.13990.5000
Supplier: MilliporeSigma

Certificates


Image Unavailable-AA13490-30

Cesium bromide ≥99% (metals basis)

Description: Crystals for infrared spectroscopy, x-ray fluorescent screens, scintillation counters
Catalog Number: AA13490-30
Supplier: Thermo Scientific Chemicals

SDS Certificates


Image Unavailable-100499-690

MAC X-ray Fluorescence Standards, Electron Microscopy Sciences

Description: MAC X-ray Microanalysis standards are supplied as 33 m (<sup>1</sup>/<sub>4</sub>") diameter pressed pellets or metal foils, and are prepared from selected high purity elements and compounds to ensure interference free-spectra. They are suitable for use by experienced spectroscopists as well as staff training.
Catalog Number: 100499-690
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100488-088

MAC X-ray Microanalysis Standards Universal Set, Electron Microscopy Sciences

Description: All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems
Catalog Number: 100488-088
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-030

MAC X-ray Microanalysis Standards for Special Holders, Electron Microscopy Sciences

Description: MAC X-ray Microanalysis Standards for Special Holders, Electron Microscopy Sciences
Catalog Number: 100495-030
Supplier: Electron Microscopy Sciences


Image Unavailable-100495-240

MAC X-ray Microanalysis NBS Standards, Electron Microscopy Sciences

Description: All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. All of our standards are polished to a 0.25 micron diamond finish and carbon coated. They are supplied with fully authenticated certificates of analyses and a location map for standard identification.
Catalog Number: 100495-240
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-76468-748

MAC X-ray Microanalysis Individual Standards, Singles, Electron Microscopy Sciences

Description: All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.
Catalog Number: 76468-748
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-100495-014

Customized Multielement X-ray Microanalysis Standards, Electron Microscopy Sciences

Description: All standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.
Catalog Number: 100495-014
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-228

MAC X-ray Microanalysis Individual Standards, Grains, Electron Microscopy Sciences

Description: All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.
Catalog Number: 100495-228
Supplier: Electron Microscopy Sciences


Product Image-100495-132

MAC X-Ray Microanalysis Individual Standards, Micro-Analysis Consultants

Description: All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.
Catalog Number: 100495-132
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100488-092

MAC X-ray Microanalysis Standards Biological Set, Electron Microscopy Sciences

Description: All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems
Catalog Number: 100488-092
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-76439-560

X-Ray Windows, Electron Microscopy Sciences

Description: X-Ray Windows are the ideal substrates for x-ray microscopy and x-ray spectroscopy techniques. State-of-the-art manufacturing and expert engineering allow for competitive prices of these windows. Made in the USA, these X-Ray windows are entirely plasma cleanable to remove organic contamination. Flat, uniformly deposited films provide consistent backgrounds with low field-to-field variability and high x-ray transmission.
Catalog Number: 76439-560
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-100495-290

MAC Auger Electron Microscopy Standards, Electron Microscopy Sciences

Description: MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when used with the Auger Electron Microscopy (AES). (Auger electron: one of the electrons ejected from an atom as a result of the internal conversion of its own X-ray in the auger effect. Auger effect: a process in which an atom singly ionized by emitting one electron with energy in the X-ray range instead of emitting the usual X-ray photon on recovery undergoes a transition in which a second electron is emitted).
Catalog Number: 100495-290
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Image Unavailable-IC0219386025

Ammonium sulfide 20% in aqueous solution

Description: Ammonium sulfide solution (aqueous ammonium sulfide) is a 20% solution in water. Ammonium sulfide is an inorganic salt with a sulfurous odor, which is commonly used in the food industry as a flavoring agent. The influence of ammonium sulfide treatment on (100)GaAs (gallium arsenide) surfaces has been studied by X-ray photoelectron spectroscopy (XPS) and reflection high-energy electron diffraction (RHEED). Its potential as an alternative to hydrogen sulfide for the transformation of activated amides to thioamides by thiolysis has been investigated.The reaction of ammonium sulfide with 3-hydroxy-2-butanone over a range of temperature has been reported to form various flavor compounds.
Catalog Number: IC0219386025
Supplier: MP Biomedicals

Certificates


Image Unavailable-76439-544

EDX/XEDS Calibration TEM Window Grid, Electron Microscopy Sciences

Description: Suspended germanium provides a unique calibration standard for x-ray energy dispersive spectroscopy. Since Ge is not typically found in TEM columns, the calibration samples provide a material that cannot be mistaken for instrument components and their signal peaks. The regime in which system peaks normally occur (2 to 9 keV and 11 to 20 keV) is devoid of peaks from the Ge.
Catalog Number: 76439-544
Supplier: ELECTRON MICROSCOPY SCIENCE
Image Unavailable-H-4902.0001BA

E-76

Description: Anticoagulant and antithrombotic peptides. Please see also the product family 'Hirudin Fragments and Analogs', the inhibitors N-1065, N-1215, N-1260, N-1565, and N-1970, and the anticoagulant anisindione, Q-1085.
Catalog Number: H-4902.0001BA
Supplier: Bachem Americas
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