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Product Image-76439-598

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 9nm, Window dimension: (2) 100x1500um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 9nm, Window dimension: (2) 100x1500um
Catalog Number: 76439-598
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-600

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 15nm, Window dimension: (8) 100 sq, (1) 100x350um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 15nm, Window dimension: (8) 100 sq, (1) 100x350um
Catalog Number: 76439-600
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-590

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, Window dimension: 25um square, 5nm

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, Window dimension: 25um square, 5nm
Catalog Number: 76439-590
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-602

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 15nm, Window dimension: (2) 100x1500um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 15nm, Window dimension: (2) 100x1500um
Catalog Number: 76439-602
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-592

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 5nm, Window dimension: (8) 50um sq, 1) 50x100um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 5nm, Window dimension: (8) 50um sq, 1) 50x100um
Catalog Number: 76439-592
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-596

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 9nm, Window dimension: (8) 100 sq, (1) 100x350um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 9nm, Window dimension: (8) 100 sq, (1) 100x350um
Catalog Number: 76439-596
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-594

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 5nm, Window dimension: (2) 50x1500um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 5nm, Window dimension: (2) 50x1500um
Catalog Number: 76439-594
Supplier: ELECTRON MICROSCOPY SCIENCE
Image Unavailable-10140-400

Starter Unit

Description: Single Sided Starter is the first building block for the single sided system. Two uprights and a worksurface assembly with 180degree rolled front edge, dimension:30X72X72inch, standard version, Quick Ship Dimension 4 Workstations.
Catalog Number: 10140-400
Supplier: TRESTON IAC LLC

UL Listed cUL Listed CSA Certified


Image Unavailable-10140-398

Starter Unit

Description: Single Sided Starter is the first building block for the single sided system. Two uprights and a worksurface assembly with 180degree rolled front edge, dimension: 30X60X72inch, standard version, Quick Ship Dimension 4 Workstations
Catalog Number: 10140-398
Supplier: TRESTON IAC LLC

UL Listed cUL Listed CSA Certified


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