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Description: Combines shortwave UV lamp with dc power supply (9V battery).
Catalog Number: 21474-564
Supplier: Analytik Jena US

Small Business Enterprise Product available on GSA Advantage®


Description: Lamp Uvm-225D 25W 302Nm 230V
Catalog Number: 89237-362
Supplier: Analytik Jena US

Product available on GSA Advantage®


Description: Lamp Uvm-225D 25W 302Nm 115V
Catalog Number: 89237-360
Supplier: Analytik Jena US

Product available on GSA Advantage®


Description: Lamp Uvs-225D 25W 254Nm 115V
Catalog Number: 89237-368
Supplier: Analytik Jena US

Product available on GSA Advantage®


Description: Lamp Uvl-225D 25W 365Nm 230V
Catalog Number: 89237-366
Supplier: Analytik Jena US

Product available on GSA Advantage®


Description: Lamp Uvls-225D 25W 2Uv 230V
Catalog Number: 89237-374
Supplier: Analytik Jena US

Product available on GSA Advantage®


Description: Uniform source of high-intensity shortwave UV for applications including bacteria destruction, sterilization, and photochemistry. Mounts to transformer base. 115V.
Catalog Number: 74660-012
Supplier: Analytik Jena US

Small Business Enterprise Product available on GSA Advantage®


Description: Lamp Uvl-225D 25W 365Nm 115V
Catalog Number: 89237-364
Supplier: Analytik Jena US

Product available on GSA Advantage®


Description: Lamp Uvs-225D 25W 254Nm 230V
Catalog Number: 89237-370
Supplier: Analytik Jena US

Product available on GSA Advantage®


Description: Lamp Uvls-225D 25W 2Uv 115V
Catalog Number: 89237-372
Supplier: Analytik Jena US

Product available on GSA Advantage®


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 2500um, Membrane: 200nm
Catalog Number: 76439-560
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 100nm
Catalog Number: 76439-554
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 100um, Membrane: 50nm
Catalog Number: 76439-552
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1500um, Membrane: 200nm
Catalog Number: 76439-558
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 50nm
Catalog Number: 76439-550
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1000um, Membrane: 100nm
Catalog Number: 76439-556
Supplier: ELECTRON MICROSCOPY SCIENCE


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