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Description: Foil, Type: R 1.2/20, Holey Carbon Film, Grid Type: Nickel 400 Mesh, Hole Size: 1.2um, Spacing: 20um, Period: 21.2um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-090
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R1.2/1.3, Grid Type: Gold, 300 Mesh, Hole Size: 1.3 um, used at Magnifications of 50,000x and higher, Period: 3.7 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)/low-energy electron point source
Catalog Number: 76440-526
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 1.2/20, Holey Carbon Film, Grid Type: Nickel 400 Mesh, Hole Size: 1.2um, Spacing: 20um, Period: 21.2um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-218
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 1.2/20, Holey Carbon Film, Grid Type: Nickel 400 Mesh, Hole Size: 1.2um, Spacing: 20um, Period: 21.2um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-314
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 1.2/20, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 1.2um, Spacing: 20um, Period: 21.2um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-040
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 1.2/20, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 1.2um, Spacing: 20um, Period: 21.2um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-188
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R1.2/1.3, Grid Type: Copper, 300 Mesh, Hole Size: 1.3 um, used at Magnifications of 50,000x and higher, Period: 3.7 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)/low-energy electron point source
Catalog Number: 76440-538
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 1.2/1.3, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 1.2um, Spacing: 1.3um, Period: 2.5um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-020
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 1.2/20, Holey Carbon Film, Grid Type: Gold 400 Mesh, Hole Size: 1.2um, Spacing: 20um, Period: 21.2um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-154
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R1.2/1.3, Grid Type: Copper, 200 Mesh, Hole Size: 1.3 um, used at Magnifications of 50,000x and higher, Period: 3.7 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)/low-energy electron point source
Catalog Number: 76440-358
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R1.2/1.3, Grid Type: Gold, 200 Mesh, Hole Size: 1.3 um, used at Magnifications of 50,000x and higher, Period: 3.7 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)/low-energy electron point source
Catalog Number: 76440-146
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 1.2/20, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 1.2um, Spacing: 20um, Period: 21.2um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-284
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, R 1.2/1.3um, Type: Gold Grid 300 Mesh, with Carbon film, Predefined holes, Hole Size: approx 1.2um, Period: 2.5um, Has advantages in electron microscopy, A foil with approx 1.2um circular holes and a spacing of approx 1.3um between the holes, This type is used at magnifications around 50000x
Catalog Number: 76440-832
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, R 1.2/1.3um, Type: Gold Grid 300 Mesh, with Carbon film, Predefined holes, Hole Size: approx 1.2um, Period: 2.5um, Has advantages in electron microscopy, A foil with approx 1.2um circular holes and a spacing of approx 1.3um between the holes, This type is used at magnifications around 50000x
Catalog Number: 76440-734
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R1.2/1.3, Grid Type: Copper, 200 Mesh, Hole Size: 1.3 um, used at Magnifications of 50,000x and higher, Period: 3.7 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)/low-energy electron point source
Catalog Number: 76440-200
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 1.2/1.3, Holey Carbon Film, Grid Type: Gold 400 Mesh, Hole Size: 1.2um, Spacing: 1.3um, Period: 2.5um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76440-966
Supplier: ELECTRON MICROSCOPY SCIENCE


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