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Description: Benchtop pH Meter, A-AB41PH-F, Measurement Range: -2.000 - 20.000 pH;-10.0 deg C - 125.0 deg C;-2000.00 - +2000.00 Mv, Measurement Resolution: 0.1 mV;0.1 deg C;0.001 pH, 6.5in Segment & Dot matrix LCD with backlight, RS232, USB Device with AC adapter, Dimension: 8.3x2x5.6in
Catalog Number: 76518-250
Supplier: Ohaus


Description: Benchtop pH Meter, A-AB41PH-B, Measurement Range: -2.000 - 20.000 pH;-10.0 deg C - 125.0 deg C;-2000.00 - +2000.00 Mv, Measurement Resolution: 0.1 mV;0.1 deg C;0.001 pH, 6.5in Segment & Dot matrix LCD with backlight, RS232, USB Device with AC adapter, Dimension: 8.3x2x5.6in
Catalog Number: 76518-248
Supplier: Ohaus


Description: Foil, Type: R 2/1 with Ultrathin Carbon, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 2um, Spacing: 1um, Period: 3um, Magnifications of 30.000x to 40.000x, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-032
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 2/2 with Ultrathin Carbon, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 2um, Spacing: 2um, Period: 4um, Magnifications of 30.000x to 40.000x, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-190
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 2/4 with Ultrathin Carbon, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 2um, Spacing: 4um, Period: 6um, Magnifications of 30.000x to 40.000x, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-290
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 2/4 with Ultrathin Carbon, Holey Carbon Film, Grid Type: Gold 400 Mesh, Hole Size: 2um, Spacing: 4um, Period: 6um, Magnifications of 30.000x to 40.000x, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76440-938
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, R 2/2 um, Type: Copper Grid 300 Mesh, with Carbon film, Predefined holes, Hole Size: 2 um, Period: 4 um, Hole size is 17.5 um, Holey films with 2 um circular holes are used at magnifications between 30,000x and 40,000x, It has advantages in electron microscopy (EM) or LEEPS microscopy
Catalog Number: 76440-632
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, R 1/2 um, Type: Copper Grid 300 Mesh, with Carbon film, Predefined holes, Hole Size: 1 um, Period: 3 um, It has advantages in electron microscopy (EM) or low-energy electron point source microscopy, Space between holes is 2 um. Center to center is 3 um, Magnifications of 30.000x to 40.000x
Catalog Number: 76440-778
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 2/4 with Ultrathin Carbon, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 2um, Spacing: 4um, Period: 6um, Magnifications of 30.000x to 40.000x, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-194
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 2/2 with Ultrathin Carbon, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 2um, Spacing: 2um, Period: 4um, Magnifications of 30.000x to 40.000x, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-042
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, R 2/2 um, Type: Gold Grid 300 Mesh, with perforated Carbon film, pre-defined holes, Hole Size: 2 um, Period: 4 um, It has advantages in electron microscopy (EM), Holey films with 2 um circular holes are used at magnifications between 30,000x and 40,000x, Space between holes is 2 um
Catalog Number: 76440-578
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, R 2/1 um, Type: Copper Grid 300 Mesh, Predefined holes, with Holey Carbon film, Hole Size: 1 um, Period: 3 um, It has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy when compared with conventional holey film, Magnifications of 30.000x to 40.000x
Catalog Number: 76440-626
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 2/4 with Ultrathin Carbon, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 2um, Spacing: 4um, Period: 6um, Magnifications of 30.000x to 40.000x, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-050
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, R2/1um, Type: Copper Grid 300 Mesh, with Carbon film, Predefined holes, Hole Size: 1um, Period: 3um, It has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy when compared with conventional holey film, Magnifications of 30.000x to 40.000x
Catalog Number: 76440-540
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 2/4 with Ultrathin Carbon, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 2um, Spacing: 4um, Period: 6um, Magnifications of 30.000x to 40.000x, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76440-950
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 2/1 with Ultrathin Carbon, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 2um, Spacing: 1um, Period: 3um, Magnifications of 30.000x to 40.000x, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-280
Supplier: ELECTRON MICROSCOPY SCIENCE


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