MAC X-ray Microanalysis Standards Universal Set, Electron Microscopy Sciences
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All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems
A set of 42 standards for general Energy Dispersive Analysis, mounted in 25 or 32 mm diameter brass stub. Includes Ag, Al2O3, Au, BaF2, Bi, CaSiO3, Cd, CeAl2, Co, Cr, Cu, Fe, FeS2, GaP, Ge, Hf, HgTe, InAs, Ir, KAlSi3O8, LaB6, MgO, Mn, Mo, NaAlSi3O8, Nb, Ni, PbTe, Pd, Pt, Rh, Sb, Se, Sn, SrF2, Ta , Ti, V, W, Y, Zn, and Zr.
All of our standards are polished to a 0.25 micron diamond finish and carbon coated. They are supplied with fully authenticated certificates of analyses and a location map for standard identification.
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